DocumentCode
3099530
Title
Simple Analytical Models to Predict Conducted EMI Noise in a Power Electronic Converter
Author
Mainali, Krishna ; Oruganti, Ramesh
Author_Institution
Nat. Univ. of Singapore, Singapore
fYear
2007
fDate
5-8 Nov. 2007
Firstpage
1930
Lastpage
1936
Abstract
Knowing the characteristics of the sources and paths involved in the injection of conducted electromagnetic interference (EMI) currents into the input source from a power converter allows one to analyze and improve a converter´s electromagnetic compatibility (EMC) performance. In this paper, analytical models to predict the conducted EMI noise generated by a boost power factor correction (PFC) converter are presented. These simple models are based on the noise generation mechanism and the path through which the noise travel. The models require the measurement of high frequency characteristics of the components involved in the noise path. By comparing the predicted noise spectra with the experimentally measured noise spectra, it is verified that the proposed analytical models can be used to reasonably predict the noise generated by the PFC. The proposed models can thus be used to carry out a preliminary design of the EMI filters needed and hence their size and cost even before building and testing the power converter.
Keywords
electromagnetic compatibility; electromagnetic interference; power convertors; power factor correction; EMI filters; boost power factor correction converter; conducted EMI noise; conducted electromagnetic interference currents; electromagnetic compatibility; noise generation mechanism; noise path; noise spectra; power electronic converter; Analytical models; Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic interference; Noise generators; Noise measurement; Performance analysis; Power electronics; Power generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics Society, 2007. IECON 2007. 33rd Annual Conference of the IEEE
Conference_Location
Taipei
ISSN
1553-572X
Print_ISBN
1-4244-0783-4
Type
conf
DOI
10.1109/IECON.2007.4460236
Filename
4460236
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