DocumentCode :
3099530
Title :
Simple Analytical Models to Predict Conducted EMI Noise in a Power Electronic Converter
Author :
Mainali, Krishna ; Oruganti, Ramesh
Author_Institution :
Nat. Univ. of Singapore, Singapore
fYear :
2007
fDate :
5-8 Nov. 2007
Firstpage :
1930
Lastpage :
1936
Abstract :
Knowing the characteristics of the sources and paths involved in the injection of conducted electromagnetic interference (EMI) currents into the input source from a power converter allows one to analyze and improve a converter´s electromagnetic compatibility (EMC) performance. In this paper, analytical models to predict the conducted EMI noise generated by a boost power factor correction (PFC) converter are presented. These simple models are based on the noise generation mechanism and the path through which the noise travel. The models require the measurement of high frequency characteristics of the components involved in the noise path. By comparing the predicted noise spectra with the experimentally measured noise spectra, it is verified that the proposed analytical models can be used to reasonably predict the noise generated by the PFC. The proposed models can thus be used to carry out a preliminary design of the EMI filters needed and hence their size and cost even before building and testing the power converter.
Keywords :
electromagnetic compatibility; electromagnetic interference; power convertors; power factor correction; EMI filters; boost power factor correction converter; conducted EMI noise; conducted electromagnetic interference currents; electromagnetic compatibility; noise generation mechanism; noise path; noise spectra; power electronic converter; Analytical models; Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic interference; Noise generators; Noise measurement; Performance analysis; Power electronics; Power generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, 2007. IECON 2007. 33rd Annual Conference of the IEEE
Conference_Location :
Taipei
ISSN :
1553-572X
Print_ISBN :
1-4244-0783-4
Type :
conf
DOI :
10.1109/IECON.2007.4460236
Filename :
4460236
Link To Document :
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