Testing analog circuits by sensitivity computation

Author

Slamani, Mustapha ; Kaminska, Bozena

Author_Institution

Dept. of Electr. Eng., Ecole Polytech. de Montreal, Que., Canada

fYear

1992

fDate

16-19 Mar 1992

Firstpage

532

Lastpage

537

Abstract

An approach is presented for fault diagnosis, at component level of analog circuits, by using functional testing. It is based on the determination of the deviation of one or many components with respect to the value fixed by the designer. Components deviation is determined by measuring a number of output parameters and by sensitivity estimation. A solution of the test equations, based on the sensitivity matrix, gives the deviation of the defective components. Different types of measurements are combined to achieve an adequate test coverage with a minimum cost. Some experimental results are given to clarify the approach and to show its efficiency

Keywords

analogue circuits; automatic testing; circuit analysis computing; failure analysis; sensitivity analysis; adequate test coverage; analog circuits; automatic testing; component level; defective components; fault diagnosis; functional testing; minimum cost; output parameters; sensitivity computation; sensitivity estimation; sensitivity matrix; test equations; Analog circuits; Analog computers; Circuit faults; Circuit testing; Cutoff frequency; Electrical fault detection; Fault diagnosis; Frequency measurement; Frequency response; Pulse measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation, 1992. Proceedings., [3rd] European Conference on

Conference_Location

Brussels

Print_ISBN

0-8186-2645-3

Type

conf

DOI

10.1109/EDAC.1992.205993

Filename

205993