DocumentCode :
3099715
Title :
Discussion Group Summary Report Designing in Reliability - Dir
Author :
Poulter, Mark ; Vigrass, William
Author_Institution :
National Semiconductor Corporation, CA
fYear :
1997
fDate :
13-16 Oct. 1997
Firstpage :
119
Lastpage :
120
Keywords :
Drives; Instruments; Manufacturing processes; Packaging; Performance evaluation; Process design; Qualifications; Semiconductor device manufacture; Semiconductor device reliability; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 1997 IEEE International
Conference_Location :
Lake Tahoe, CA, USA
Print_ISBN :
0-7803-4205-4
Type :
conf
DOI :
10.1109/IRWS.1997.660298
Filename :
660298
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3099715
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