DocumentCode
3100019
Title
Principles of operation for a fast, low-voltage digital switch
Author
Theis, Thomas N.
Author_Institution
T.J. Watson Res. Center, IBM Res., Albany, NY, USA
fYear
2011
fDate
7-9 Dec. 2011
Firstpage
1
Lastpage
1
Abstract
Reduced energy dissipation in device switching may be the most critical attribute for the success of any new switch which can replace the field effect transistor for digital logic. There are two very distinct physical approaches to this goal. The first approach is to store less energy in the device to distinguish digital logic states. The second approach is to conserve the stored energy from switching event to switching event by implementing near-adiabatic switching protocols and energy-conserving logic circuits. Here I focus on the first approach which is broadly compatible with well-established circuit families. Since the stored energy is 1/2 CV2, it is highly desirable to reduce the power supply voltage. However, minimum supply voltages for conventional FETs must be many times kT/e in order to maintain an acceptably large distinction between ON and OFF currents, and are already severely constrained by this limit. Altering the device physics to improve the subthreshold slope is essential for the realization of fast logic at very low voltages. Thermal voltage noise sets the true low-voltage limit for such devices [1], and at room temperature that limit is far below the roughly 1V limit for low-voltage operation of fast FETs of conventional design.
Keywords
field effect transistor switches; logic circuits; FET; device switching; digital logic states; energy-conserving logic circuits; field effect transistor; low-voltage digital switch; near-adiabatic switching protocols; power supply voltage; reduced energy dissipation; temperature 293 K to 298 K; thermal voltage noise; voltage 1 V; Capacitance; Electric potential; FETs; Logic gates; Switches; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location
College Park, MD
Print_ISBN
978-1-4577-1755-0
Type
conf
DOI
10.1109/ISDRS.2011.6135284
Filename
6135284
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