• DocumentCode
    3100019
  • Title

    Principles of operation for a fast, low-voltage digital switch

  • Author

    Theis, Thomas N.

  • Author_Institution
    T.J. Watson Res. Center, IBM Res., Albany, NY, USA
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Reduced energy dissipation in device switching may be the most critical attribute for the success of any new switch which can replace the field effect transistor for digital logic. There are two very distinct physical approaches to this goal. The first approach is to store less energy in the device to distinguish digital logic states. The second approach is to conserve the stored energy from switching event to switching event by implementing near-adiabatic switching protocols and energy-conserving logic circuits. Here I focus on the first approach which is broadly compatible with well-established circuit families. Since the stored energy is 1/2 CV2, it is highly desirable to reduce the power supply voltage. However, minimum supply voltages for conventional FETs must be many times kT/e in order to maintain an acceptably large distinction between ON and OFF currents, and are already severely constrained by this limit. Altering the device physics to improve the subthreshold slope is essential for the realization of fast logic at very low voltages. Thermal voltage noise sets the true low-voltage limit for such devices [1], and at room temperature that limit is far below the roughly 1V limit for low-voltage operation of fast FETs of conventional design.
  • Keywords
    field effect transistor switches; logic circuits; FET; device switching; digital logic states; energy-conserving logic circuits; field effect transistor; low-voltage digital switch; near-adiabatic switching protocols; power supply voltage; reduced energy dissipation; temperature 293 K to 298 K; thermal voltage noise; voltage 1 V; Capacitance; Electric potential; FETs; Logic gates; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium (ISDRS), 2011 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4577-1755-0
  • Type

    conf

  • DOI
    10.1109/ISDRS.2011.6135284
  • Filename
    6135284