Title :
Discussion Group Summary Customer Reliability Requirements
Author :
Wylie, Ian ; Preussger, Andreas
Author_Institution :
Siemens AC, Munich, Germany
Keywords :
Current supplies; Manufacturing processes; Safety; Semiconductor device reliability; Stability; Telecommunications; Testing;
Conference_Titel :
Integrated Reliability Workshop Final Report, 1997 IEEE International
Conference_Location :
Lake Tahoe, CA, USA
Print_ISBN :
0-7803-4205-4
DOI :
10.1109/IRWS.1997.660300
