• DocumentCode
    3100263
  • Title

    Low Voltage Distribution Transformers: Analysis of the Exposure to ELF Magnetic Fields

  • Author

    Mitolo, Massimo ; Freschi, Fabio ; Pastorelli, Michele ; Tartaglia, Michele

  • Author_Institution
    Chu & Gassman, Middlesex
  • fYear
    2007
  • fDate
    5-8 Nov. 2007
  • Firstpage
    1320
  • Lastpage
    1323
  • Abstract
    Modern residential, industrial or commercial buildings may be grounded through a system defined as "TN- Island grounding system". This is an effective way to protect both persons from shock hazard in installations and to greatly limit electrical interferences among power systems. This earthing system, which is aimed to promote electrical safety, better functionality, and lower costs, utilizes single-phase separation transformers installed in the unit grounded at the mid-point of their secondary side. By introducing a new source of power frequency (i.e. extremely low frequency) magnetic fields into the premises, the presence of such additional pieces of equipment in the environment, might expose persons to their potential adverse health effects, as well as, sensitive electronic equipment disturbances. This paper seeks to clarify this matter by evaluating the ELF magnetic fields, as produced by the user\´s own equipment and by other units eventually present in the vicinity.
  • Keywords
    earthing; electrical safety; power transformers; earthing system; electrical interferences; electrical safety; island grounding system; low voltage distribution transformers; power frequency; sensitive electronic equipment disturbances; shock hazard; single-phase separation transformers; Electrical equipment industry; Frequency; Geophysical measurement techniques; Ground penetrating radar; Grounding; Low voltage; Magnetic analysis; Magnetic fields; Power system protection; Transformers; ELF magnetic field; Grounding; Transformer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 2007. IECON 2007. 33rd Annual Conference of the IEEE
  • Conference_Location
    Taipei
  • ISSN
    1553-572X
  • Print_ISBN
    1-4244-0783-4
  • Type

    conf

  • DOI
    10.1109/IECON.2007.4460284
  • Filename
    4460284