DocumentCode
3100295
Title
Vectorial measurement of the 2nd harmonic response of an FBAR resonator
Author
Baytpur, Farhad ; Fouladi, Siamak ; Jong-Hoon Lee ; Dong Shim ; Larson, Jeffrey ; Feld, David
Author_Institution
Wireless Semicond. Div., AVAGO Technol., San Jose, CA, USA
fYear
2013
fDate
21-25 July 2013
Firstpage
247
Lastpage
250
Abstract
We have measured the phase and magnitude (“vector”) response of the 2nd harmonic emissions of a thin film bulk acoustic (FBAR) resonator. The phase measurement is the difference in phase between the emitted 2nd harmonic waveform and that of the incident waveform. Although the magnitude has been measured previously by various investigators [1], [2], we are not aware of a phase measurement prior to this work. The phase measurement presents a challenge because it requires an elaborate measurement setup with a sophisticated calibration procedure. Using Agilent´s non-linear vector network analyzer (NVNA) we have measured the standard S11 response of a resonator as well as the vector response of its 2nd harmonic emissions. We have observed that: (1) phase vs. frequency plots of the 2nd harmonic have the same shape as the phase of S11 and (2) the magnitude vs. frequency plots of the 2nd harmonic are proportional to the group delay of S11.
Keywords
acoustic resonators; bulk acoustic wave devices; calibration; network analysers; phase measurement; semiconductor thin films; Agilent nonlinear vector network analyzer; NVNA; group delay; incident waveform; phase measurement; second harmonic response; thin film bulk acoustic resonator; vector response; vectorial measurement; Harmonic analysis; III-V semiconductor materials; Mathematical model; Phase measurement; Resonant frequency; Stress; Vectors; Nonlinearity; nonlinear modeling; nonlinear vector network analyzer; phase measurement; piezoelectric resonator; second harmonic generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2013 IEEE International
Conference_Location
Prague
ISSN
1948-5719
Print_ISBN
978-1-4673-5684-8
Type
conf
DOI
10.1109/ULTSYM.2013.0064
Filename
6725227
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