• DocumentCode
    3100295
  • Title

    Vectorial measurement of the 2nd harmonic response of an FBAR resonator

  • Author

    Baytpur, Farhad ; Fouladi, Siamak ; Jong-Hoon Lee ; Dong Shim ; Larson, Jeffrey ; Feld, David

  • Author_Institution
    Wireless Semicond. Div., AVAGO Technol., San Jose, CA, USA
  • fYear
    2013
  • fDate
    21-25 July 2013
  • Firstpage
    247
  • Lastpage
    250
  • Abstract
    We have measured the phase and magnitude (“vector”) response of the 2nd harmonic emissions of a thin film bulk acoustic (FBAR) resonator. The phase measurement is the difference in phase between the emitted 2nd harmonic waveform and that of the incident waveform. Although the magnitude has been measured previously by various investigators [1], [2], we are not aware of a phase measurement prior to this work. The phase measurement presents a challenge because it requires an elaborate measurement setup with a sophisticated calibration procedure. Using Agilent´s non-linear vector network analyzer (NVNA) we have measured the standard S11 response of a resonator as well as the vector response of its 2nd harmonic emissions. We have observed that: (1) phase vs. frequency plots of the 2nd harmonic have the same shape as the phase of S11 and (2) the magnitude vs. frequency plots of the 2nd harmonic are proportional to the group delay of S11.
  • Keywords
    acoustic resonators; bulk acoustic wave devices; calibration; network analysers; phase measurement; semiconductor thin films; Agilent nonlinear vector network analyzer; NVNA; group delay; incident waveform; phase measurement; second harmonic response; thin film bulk acoustic resonator; vector response; vectorial measurement; Harmonic analysis; III-V semiconductor materials; Mathematical model; Phase measurement; Resonant frequency; Stress; Vectors; Nonlinearity; nonlinear modeling; nonlinear vector network analyzer; phase measurement; piezoelectric resonator; second harmonic generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2013 IEEE International
  • Conference_Location
    Prague
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4673-5684-8
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2013.0064
  • Filename
    6725227