DocumentCode :
3100319
Title :
Discussion Group Summary Reliability Test Structures
Author :
Turner, Timothy
Author_Institution :
Keithley Instruments, Cleveland, OH
fYear :
1997
fDate :
13-16 Oct. 1997
Firstpage :
125
Lastpage :
125
Keywords :
Circuit testing; Electromigration; Failure analysis; Instruments; Monitoring; Process control; Production; Qualifications; Random access memory; Size control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 1997 IEEE International
Conference_Location :
Lake Tahoe, CA, USA
Print_ISBN :
0-7803-4205-4
Type :
conf
DOI :
10.1109/IRWS.1997.660301
Filename :
660301
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3100319
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