DocumentCode :
310034
Title :
1 Gb/s operation and bit error rate studies of diode-clamped FET-SEED smart pixel receivers
Author :
Woodward, T.K. ; Lentine, A.L. ; Chirovsky, L.M.F.
Author_Institution :
AT&T Bell Labs., Holmdel, NJ, USA
Volume :
1
fYear :
1994
fDate :
31 Oct-3 Nov 1994
Firstpage :
76
Abstract :
Smart pixel technology is targeted at the realization of large numbers of optical input and output from electronic chips. Two key components of this technology are the receiver and transmitter. Here we discuss the performance of receiver modules based on diode-clamped FET-SEED circuits. We present the operation of diode-clamped receivers with electrical output operating at rates up to 1 Gb/s. Further, we report the first bit error rate testing of this receiver. Since receivers of this type are envisioned to be present in large numbers on electronic processing chips, constraints on power consumption and chip area are present that do not normally bear on the design of conventional telecommunications receivers. Therefore, one may consider the smart pixel receiver to represent a new class of device
Keywords :
optical receivers; 1 Gbit/s; bit error rate; diode-clamped FET-SEED circuits; electronic chips; smart pixel receivers; Bit error rate; Clamps; Diodes; FETs; Logic circuits; Optical buffering; Optical receivers; Optical transmitters; Smart pixels; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1470-0
Type :
conf
DOI :
10.1109/LEOS.1994.586899
Filename :
586899
Link To Document :
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