DocumentCode :
3100399
Title :
Realization of vertically-aligned GaN n-p core-shell nanoscale structures using top-down fabrication
Author :
Paramanik, Dipak ; Aluri, Geetha ; Krylyuk, Sergiy ; Motayed, Abhishek ; King, Matthew ; McLaughlin, Sean ; Gupta, Shalini ; Cramer, Harlan ; Davydov, Albert V. ; Nikoobakht, Babak
Author_Institution :
Mater. Meas. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear :
2011
fDate :
7-9 Dec. 2011
Firstpage :
1
Lastpage :
2
Abstract :
In this contribution, we report on development of a hybrid approach to produce arrays of vertically aligned GaN n-p core-shell structures. First, we fabricated nanoscale n-type GaN pillars by inductively coupled plasma (ICP) etching which were subsequently overgrown by p-type GaN shell using halide vapor phase epitaxy (HVPE) process. We will present results on the optimization of the ICP etching procedure, in particular ICP and radio frequency (RF) powers, to obtain GaN pillars with vertical and smooth sidewalls. Preliminary results on HVPE overgrowth and characterization of core-shell GaN pillars will be discussed as well.
Keywords :
III-V semiconductors; gallium compounds; nanofabrication; nanostructured materials; p-n junctions; semiconductor growth; sputter etching; vapour phase epitaxial growth; wide band gap semiconductors; GaN; HVPE overgrowth; ICP etching procedure optimization; ICP power; core-shell GaN pillars; halide vapor phase epitaxy process; hybrid approach; inductively coupled plasma etching; nanoscale n-type GaN pillars; p-type GaN shell; radiofrequency power; smooth sidewall; top-down fabrication; vertical sidewall; vertically aligned GaN n-p core-shell structure arrays; vertically-aligned GaN n-p core-shell nanoscale structures; Educational institutions; Etching; Films; Gallium nitride; Iterative closest point algorithm; Nanostructures; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4577-1755-0
Type :
conf
DOI :
10.1109/ISDRS.2011.6135306
Filename :
6135306
Link To Document :
بازگشت