DocumentCode :
3100409
Title :
Composite defects diagnosis using parameter optimization based support vector machine
Author :
Chun, Wen Xiang ; Wai Yie Leong
Author_Institution :
Nanyang Technol. Univ., Singapore, Singapore
fYear :
2010
fDate :
15-17 June 2010
Firstpage :
2300
Lastpage :
2305
Abstract :
This study concerns with the diagnosis of composite defects using pitch-catch method in aircraft material by applying the Wavelet transform (WT) analysis, PCA along with support vector machine (SVM). A novel application is presented exploring the problem of detection and estimation of the various defects; the early detection and classification of aircraft defects is of particular importance, as the defects can lead to severe problem due to material failure, component analysis was performed initially to extract the features and to reduce the dimension of the original data features. Kernel parameters selection of support vector machine is a very important problem, which has great influence on the performance of support vector machine. This paper exploits the parameter optimization procedure to ensure the generalization ability of SVM. The result shows that multi-class SVM produces promising results and has the potential for use in fault diagnosis.
Keywords :
aircraft manufacture; fault diagnosis; optimisation; principal component analysis; production engineering computing; support vector machines; wavelet transforms; PCA; aircraft defects; aircraft material; composite defects diagnosis; fault diagnosis; parameter optimization; pitch-catch method; support vector machine; wavelet transform; Aerospace materials; Aircraft manufacture; Data mining; Failure analysis; Performance analysis; Principal component analysis; Support vector machine classification; Support vector machines; Wavelet analysis; Wavelet transforms; Kernal parameter; Pitch-catch method; Principal Ccomponent Analysis; Support Vector Machine; Wavelet transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
Conference_Location :
Taichung
Print_ISBN :
978-1-4244-5045-9
Electronic_ISBN :
978-1-4244-5046-6
Type :
conf
DOI :
10.1109/ICIEA.2010.5515481
Filename :
5515481
Link To Document :
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