• DocumentCode
    3100409
  • Title

    Composite defects diagnosis using parameter optimization based support vector machine

  • Author

    Chun, Wen Xiang ; Wai Yie Leong

  • Author_Institution
    Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2010
  • fDate
    15-17 June 2010
  • Firstpage
    2300
  • Lastpage
    2305
  • Abstract
    This study concerns with the diagnosis of composite defects using pitch-catch method in aircraft material by applying the Wavelet transform (WT) analysis, PCA along with support vector machine (SVM). A novel application is presented exploring the problem of detection and estimation of the various defects; the early detection and classification of aircraft defects is of particular importance, as the defects can lead to severe problem due to material failure, component analysis was performed initially to extract the features and to reduce the dimension of the original data features. Kernel parameters selection of support vector machine is a very important problem, which has great influence on the performance of support vector machine. This paper exploits the parameter optimization procedure to ensure the generalization ability of SVM. The result shows that multi-class SVM produces promising results and has the potential for use in fault diagnosis.
  • Keywords
    aircraft manufacture; fault diagnosis; optimisation; principal component analysis; production engineering computing; support vector machines; wavelet transforms; PCA; aircraft defects; aircraft material; composite defects diagnosis; fault diagnosis; parameter optimization; pitch-catch method; support vector machine; wavelet transform; Aerospace materials; Aircraft manufacture; Data mining; Failure analysis; Performance analysis; Principal component analysis; Support vector machine classification; Support vector machines; Wavelet analysis; Wavelet transforms; Kernal parameter; Pitch-catch method; Principal Ccomponent Analysis; Support Vector Machine; Wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
  • Conference_Location
    Taichung
  • Print_ISBN
    978-1-4244-5045-9
  • Electronic_ISBN
    978-1-4244-5046-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2010.5515481
  • Filename
    5515481