DocumentCode
3100409
Title
Composite defects diagnosis using parameter optimization based support vector machine
Author
Chun, Wen Xiang ; Wai Yie Leong
Author_Institution
Nanyang Technol. Univ., Singapore, Singapore
fYear
2010
fDate
15-17 June 2010
Firstpage
2300
Lastpage
2305
Abstract
This study concerns with the diagnosis of composite defects using pitch-catch method in aircraft material by applying the Wavelet transform (WT) analysis, PCA along with support vector machine (SVM). A novel application is presented exploring the problem of detection and estimation of the various defects; the early detection and classification of aircraft defects is of particular importance, as the defects can lead to severe problem due to material failure, component analysis was performed initially to extract the features and to reduce the dimension of the original data features. Kernel parameters selection of support vector machine is a very important problem, which has great influence on the performance of support vector machine. This paper exploits the parameter optimization procedure to ensure the generalization ability of SVM. The result shows that multi-class SVM produces promising results and has the potential for use in fault diagnosis.
Keywords
aircraft manufacture; fault diagnosis; optimisation; principal component analysis; production engineering computing; support vector machines; wavelet transforms; PCA; aircraft defects; aircraft material; composite defects diagnosis; fault diagnosis; parameter optimization; pitch-catch method; support vector machine; wavelet transform; Aerospace materials; Aircraft manufacture; Data mining; Failure analysis; Performance analysis; Principal component analysis; Support vector machine classification; Support vector machines; Wavelet analysis; Wavelet transforms; Kernal parameter; Pitch-catch method; Principal Ccomponent Analysis; Support Vector Machine; Wavelet transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
Conference_Location
Taichung
Print_ISBN
978-1-4244-5045-9
Electronic_ISBN
978-1-4244-5046-6
Type
conf
DOI
10.1109/ICIEA.2010.5515481
Filename
5515481
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