• DocumentCode
    3100518
  • Title

    Temperature adaptive driving of power semiconductor devices

  • Author

    Wu, Liang ; Castellazzi, Alberto

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Nottingham, Nottingham, UK
  • fYear
    2010
  • fDate
    4-7 July 2010
  • Firstpage
    1110
  • Lastpage
    1114
  • Abstract
    This work is about the development of a temperature-dependent driving strategy for power transistors, aimed at counterbalancing temperature related increases in their on-state resistance and power losses by a corresponding increase of the amplitude of the applied driving signal. The concept is first demonstrated on the example of a PowerMOSFET, based on semiconductor theory and circuit simulations employing electro-thermal device models; then, experimental results obtained on a first prototype of the novel driving strategy are presented. These well demonstrate the effectiveness of the proposed solution as a means of improving performance (i.e., efficiency) and reducing thermal stress (i.e., improving reliability) in the switched operation of silicon power devices.
  • Keywords
    elemental semiconductors; power MOSFET; power transistors; semiconductor device models; silicon; PowerMOSFET; Si; circuit simulations; electro-thermal device models; on-state resistance; power devices; power semiconductor devices; power transistors; semiconductor theory; temperature adaptive driving; temperature-dependent driving strategy; thermal stress; Current measurement; Driver circuits; Logic gates; MOSFET circuits; Resistance; Temperature; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics (ISIE), 2010 IEEE International Symposium on
  • Conference_Location
    Bari
  • Print_ISBN
    978-1-4244-6390-9
  • Type

    conf

  • DOI
    10.1109/ISIE.2010.5636541
  • Filename
    5636541