Title :
Electro-optic sampling of planar GaAs circuits using semiconductor laser
Author :
Sun, Wei ; Yi, Maobin ; Tian, Xiaojian ; Sun, Jianguo ; Jia, Gang
Author_Institution :
Dept. of Electron. Eng., Jilin Univ., Changchun, China
fDate :
31 Oct-3 Nov 1994
Abstract :
We have describe an electro-optic sampling with a gain-switched laser and electronic phase shifter. We have measured the propagation delay in buffered FET logic (BFL) circuit and investigated the strength of the crosstalk
Keywords :
gallium arsenide; buffered FET logic circuit; crosstalk strength; electro-optic sampling; electronic phase shifter; gain-switched laser; logic circuit testing; planar GaAs circuits; propagation delay; semiconductor laser; Circuit testing; Crosstalk; Gallium arsenide; Lasers and electrooptics; Masers; Phase shifters; Probes; Propagation delay; Sampling methods; Semiconductor lasers;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1470-0
DOI :
10.1109/LEOS.1994.586942
