Title :
Study on equivalent single conductor model of multi-walled carbon nanotube interconnects
Author :
Min Tang ; Jiaqing Lu ; Junfa Mao
Author_Institution :
Key Lab. of Minist. of Educ. of China for Res. of Design & Electromagn. Compatibility of High Speed Electron. Syst., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
The equivalent single conductor (ESC) model provides an efficient way for transient simulation of complex multi-walled carbon nanotube (MWCNT) interconnects. In this paper, the validity and accuracy of the ESC model of MWCNT are investigated when the impacts of intershell tunneling conductance and imperfect contact resistance are considered. Both the voltage distribution and terminal response are compared with the multiconductor circuit (MCC) model. Some discussions based on the numerical results of single and coupled MWCNT interconnects are given.
Keywords :
carbon nanotubes; contact resistance; equivalent circuits; integrated circuit interconnections; ESC model; equivalent single conductor model; imperfect contact resistance; intershell tunneling conductance; multiconductor circuit model; multiwalled carbon nanotube interconnects; terminal response; transient simulation; voltage distribution; Carbon nanotubes; Contact resistance; Integrated circuit interconnections; Integrated circuit modeling; Numerical models; Transient analysis; Tunneling; Multi-walled carbon nanotubes; equivalent single conductor model; interconnects; transient simulation;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2012 Asia-Pacific
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4577-1330-9
Electronic_ISBN :
978-1-4577-1331-6
DOI :
10.1109/APMC.2012.6421884
