Title :
A parameter extraction method based on Particle Swarm Optimization
Author :
Zheng, Xue ; Zhang, Guohe ; Chen, Kebin
Author_Institution :
Dept. of Microelectron., Xi´´an Jiaotong Univ., Xi´´an, China
Abstract :
Model parameter extraction plays an important role in bridging semiconductor manufacturing and integrated circuit design. Most commercial extraction and optimization tools have a default extraction and optimization procedure. PSO (Particle Swarm Optimization) is a global random searching algorithm with swarm intelligence, having the strong searching capability on nonlinear problems [1-2]. Compared with Genetic Algorithm, PSO does not require crossover and mutation operations. It can be easily understood and implemented, and has high velocity of convergence as well. Thus, it can find the optimal solution quickly during the parameter extraction [3-4]. In this work, a parameter extraction and optimization strategy using PSO is presented for SOI MOSFETs based on the BSIM SOI 3.1 model which is developed by the BSIM group of UC Berkeley [5]. The global optimal strategy and standard PSO algorithm are implemented to fulfill the extraction of direct-current parameters, which are related to gate voltage and drain voltage.
Keywords :
MOSFET; particle swarm optimisation; silicon-on-insulator; BSIM SOI 3.1 model; BSIM group; SOI MOSFET; UC Berkeley; crossover operation; default extraction; direct-current parameter extraction; drain voltage; gate voltage; genetic algorithm; global optimal strategy; global random searching algorithm; integrated circuit design; model parameter extraction method; mutation operation; nonlinear problems; optimization procedure; particle swarm optimization; semiconductor manufacturing; standard PSO algorithm; swarm intelligence; Data mining; MOSFETs; Mathematical model; Optimization; Parameter extraction; Particle swarm optimization; Semiconductor device modeling;
Conference_Titel :
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4577-1755-0
DOI :
10.1109/ISDRS.2011.6135329