Title :
Effect of test device thickness on liquid crystal characterisation
Author :
Deo, P. ; Yazdanpanahi, Mani ; Mirshekar-Syahkal, D.
Author_Institution :
Sch. of Comput. Sci. & Electron. Eng., Univ. of Essex, Colchester, UK
Abstract :
A liquid crystal (LC) test device to operate in the frequency band of 57-66 GHz is designed and the effect of its thickness in determining the dielectric properties of the LC materials is investigated. For this purpose, two LC test devices one with a thick profile and another one with a thin profile are designed and investigated. These devices are then used to extract the dielectric properties of two dielectric test materials. When comparing the dielectric constant extraction from these test devices, the thin LC test device shows better accuracy for a wider frequency band.
Keywords :
dielectric properties; liquid crystal devices; millimetre wave antennas; LC materials; dielectric properties; dielectric test materials; frequency band; liquid crystal characterisation; test device thickness effect; Dielectric constant; Dielectric losses; Dielectric materials; Microstrip; Standards; Substrates; Liquid crystal (LC); microstrip line; millimeter-wave devices;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2012 Asia-Pacific
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4577-1330-9
Electronic_ISBN :
978-1-4577-1331-6
DOI :
10.1109/APMC.2012.6421895
