DocumentCode
3101008
Title
Effect of test device thickness on liquid crystal characterisation
Author
Deo, P. ; Yazdanpanahi, Mani ; Mirshekar-Syahkal, D.
Author_Institution
Sch. of Comput. Sci. & Electron. Eng., Univ. of Essex, Colchester, UK
fYear
2012
fDate
4-7 Dec. 2012
Firstpage
1280
Lastpage
1282
Abstract
A liquid crystal (LC) test device to operate in the frequency band of 57-66 GHz is designed and the effect of its thickness in determining the dielectric properties of the LC materials is investigated. For this purpose, two LC test devices one with a thick profile and another one with a thin profile are designed and investigated. These devices are then used to extract the dielectric properties of two dielectric test materials. When comparing the dielectric constant extraction from these test devices, the thin LC test device shows better accuracy for a wider frequency band.
Keywords
dielectric properties; liquid crystal devices; millimetre wave antennas; LC materials; dielectric properties; dielectric test materials; frequency band; liquid crystal characterisation; test device thickness effect; Dielectric constant; Dielectric losses; Dielectric materials; Microstrip; Standards; Substrates; Liquid crystal (LC); microstrip line; millimeter-wave devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference Proceedings (APMC), 2012 Asia-Pacific
Conference_Location
Kaohsiung
Print_ISBN
978-1-4577-1330-9
Electronic_ISBN
978-1-4577-1331-6
Type
conf
DOI
10.1109/APMC.2012.6421895
Filename
6421895
Link To Document