DocumentCode
3101018
Title
The influence of support-configurations on the acceleration effects of doubly rotated quartz resonators at high temperatures
Author
Patel, M.S. ; Sinha, Bikash K.
Author_Institution
Math. & Modeling Dept., Schlumberger-Doll Res., Cambridge, MA, USA
fYear
2013
fDate
21-25 July 2013
Firstpage
1366
Lastpage
1369
Abstract
Acceleration sensitivity of quartz resonator is an important challenge to achieve extremely stable frequency source operating at temperatures as high as 200 degC. Previous studies of acceleration effects on a quartz resonator on simple mounts have been limited to room temperature. In this paper we present a new theoretical model to investigate the influence of different support-configurations on the acceleration effect for different doubly rotated quartz cuts for temperatures varying from 25 to 200 degC. Results are obtained for the slow (C-) and fast (B-) thickness-shear modes for these quartz cuts. The new theoretical model shows good agreement with the published measured data on the SC-, rotated X-, and SBTC-quartz cuts. Calculated results show that the mounting supports lead to an increase in the acceleration sensitivity for these cuts at 200 degC. In addition, the theoretical model suggests optimal mounting support configurations for these cuts to achieve a stable frequency source operating at temperatures as high as 200 degC.
Keywords
crystal resonators; SBTC-quartz cuts; SC-quartz cuts; acceleration effect; acceleration effects; acceleration sensitivity; doubly-rotated quartz cuts; doubly-rotated quartz resonators; fast-thickness-shear mode; frequency source stability; optimal mounting support configurations; rotated X-quartz cuts; slow-thickness-shear mode; temperature 25 degC to 200 degC; theoretical model; Acceleration; Equations; Mathematical model; Resonant frequency; Sensitivity; Strain; Stress; acceleration sensitivity; doubly-rotated quartz cuts; high temperature; mounting supports;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2013 IEEE International
Conference_Location
Prague
ISSN
1948-5719
Print_ISBN
978-1-4673-5684-8
Type
conf
DOI
10.1109/ULTSYM.2013.0347
Filename
6725261
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