Title :
Low loss and high tuning barium strontium titanate (BST) thin films
Author_Institution :
Sensors & Electron Devices Directorate, U.S. Army Res. Lab., Adelphi, MD, USA
Abstract :
A strain-relieved and epitaxially grown Ba1-xSrxTiO3(BST, x = 0.3 0.6) films on (100) MgO were prepared by pulsed laser deposition. The microstructure of the thin films, surface morphologies, grain sizes and film thickness as well as varactor electrode quality and gap size were characterized by optical microscope and scanning electron microscopes (SEM). X-ray diffraction (XRD) was used for chemical compositions and crystal structure and orientations analyses. Interdigitated varactors at different finger gap sizes were fabricated by lift-off process. Dielectric tuning, varactor capacitance and dielectric loss were measured at frequencies at 2 GHz. Relationship between the electrical properties and microstructures of the deposited thin films were investigated. Tunability of PLD BST thin film decreased with increasing interdigitaed finger gap sizes; however, Q values increased with increasing gap sizes. Thus, the inverse relationship between dielectric tuning and dielectric Q was existed, but highly improved (45% tuning and 110 Q at 10 μm gap size).
Keywords :
X-ray diffraction; barium compounds; capacitance; chemical analysis; dielectric losses; dielectric thin films; epitaxial layers; grain size; optical microscopy; pulsed laser deposition; scanning electron microscopy; strontium compounds; surface morphology; varactors; Ba1-xSrxTiO3; PLD thin film; SEM; X-ray diffraction; XRD; chemical composition; crystal orientation; crystal structure; dielectric Q; dielectric loss; dielectric tuning; electrical properties; epitaxially grown film; film thickness; gap size; grain size; high tuning barium strontium titanate thin films; interdigitaed finger gap size; interdigitated varactors; lift-off process; microstructure; optical microscopy; pulsed laser deposition; scanning electron microscopy; strain-relieved film; surface morphology; varactor capacitance; varactor electrode quality; Consumer electronics; Films; Pulsed laser deposition; Scanning electron microscopy; Tuning; Varactors;
Conference_Titel :
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4577-1755-0
DOI :
10.1109/ISDRS.2011.6135338