DocumentCode :
310140
Title :
Low-threshold-current 670 nm multi-quantum-well laser diodes
Author :
Fujii, Hiroaki ; Yoshii, Hirokazu ; Endo, Kenji ; Kishi, Tadahiko ; Makita, Hironobu ; Okuda, Junya ; Yamada, Hideyuki
Author_Institution :
ULSI Device Dev. Labs., NEC Corp., Shiga, Japan
Volume :
1
fYear :
1994
fDate :
31 Oct-3 Nov 1994
Firstpage :
317
Abstract :
There are increasing demands for low-power-consumption 670nm-band red-light-emitting laser diodes (LDs) in applications such as handy bar-code scanners, etc. In this paper the authors have developed low-threshold-current multi-quantum-well (MQW) LDs with a short-length-cavity and a high-reflectivity (HR) rear facet. Marked reduction in threshold currents has been achieved by using MQW as an active layer and by optimizations of cavity lengths considering temperature characteristics in a trade-off relation between low-threshold-currents and high-temperature-operations. Moreover, the reflectivity of a rear facet was increased to a maximum value (80%) where necessary monitor currents for an automatic-power-control could be maintained. For 150μm-long LDs, threshold current was reduced to 12.6mA (1/3 of conventional LDs), maintaining sufficient temperature characteristics for 50°C use. For 350μm-long LDs, consumption power was reduced to 1/2 of conventional LDs and long lifetimes at 60°C have been obtained
Keywords :
quantum well lasers; 12.6 mA; 150 micron; 350 micron; 50 C; 60 C; 670 nm; automatic-power-control; cavity length; high-reflectivity rear facet; high-temperature-operation; lifetime; low-power-consumption; low-threshold-current; multi-quantum-well laser diodes; red-light-emitting lasers; temperature characteristics; Capacitive sensors; Current density; Current measurement; Density measurement; Diode lasers; National electric code; Pulse measurements; Quantum well devices; Temperature; Threshold current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1470-0
Type :
conf
DOI :
10.1109/LEOS.1994.587021
Filename :
587021
Link To Document :
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