• DocumentCode
    310140
  • Title

    Low-threshold-current 670 nm multi-quantum-well laser diodes

  • Author

    Fujii, Hiroaki ; Yoshii, Hirokazu ; Endo, Kenji ; Kishi, Tadahiko ; Makita, Hironobu ; Okuda, Junya ; Yamada, Hideyuki

  • Author_Institution
    ULSI Device Dev. Labs., NEC Corp., Shiga, Japan
  • Volume
    1
  • fYear
    1994
  • fDate
    31 Oct-3 Nov 1994
  • Firstpage
    317
  • Abstract
    There are increasing demands for low-power-consumption 670nm-band red-light-emitting laser diodes (LDs) in applications such as handy bar-code scanners, etc. In this paper the authors have developed low-threshold-current multi-quantum-well (MQW) LDs with a short-length-cavity and a high-reflectivity (HR) rear facet. Marked reduction in threshold currents has been achieved by using MQW as an active layer and by optimizations of cavity lengths considering temperature characteristics in a trade-off relation between low-threshold-currents and high-temperature-operations. Moreover, the reflectivity of a rear facet was increased to a maximum value (80%) where necessary monitor currents for an automatic-power-control could be maintained. For 150μm-long LDs, threshold current was reduced to 12.6mA (1/3 of conventional LDs), maintaining sufficient temperature characteristics for 50°C use. For 350μm-long LDs, consumption power was reduced to 1/2 of conventional LDs and long lifetimes at 60°C have been obtained
  • Keywords
    quantum well lasers; 12.6 mA; 150 micron; 350 micron; 50 C; 60 C; 670 nm; automatic-power-control; cavity length; high-reflectivity rear facet; high-temperature-operation; lifetime; low-power-consumption; low-threshold-current; multi-quantum-well laser diodes; red-light-emitting lasers; temperature characteristics; Capacitive sensors; Current density; Current measurement; Density measurement; Diode lasers; National electric code; Pulse measurements; Quantum well devices; Temperature; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-1470-0
  • Type

    conf

  • DOI
    10.1109/LEOS.1994.587021
  • Filename
    587021