DocumentCode :
3101439
Title :
Permission to reprint or copy
fYear :
2009
fDate :
15-19 March 2009
Abstract :
Abstracting is permitted with credit to the source. Libraries are permitted to photocopy beyond the limit of U.S. copyright law for private use of patrons those articles in this volume that carry a code at the bottom of the first page, provided the per-copy fee indicated in the code is paid through the Copyright Clearance Center, 222 Rosewood Drive, Danvers, MA 01923 U.S.A. For other copying, reprint, or republication permission, write to IEEE Copyrights Manager, IEEE Service Center, 445 Hoes Lane, PO Box 1331, Piscataway, NJ 08866-1331 U.S.A. All rights reserved. Copyright (c)2009 by the Institute of Electrical and Electronics Engineers, Inc.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2009. SEMI-THERM 2009. 25th Annual IEEE
Conference_Location :
San Jose, CA
ISSN :
1065-2221
Print_ISBN :
978-1-4244-3664-4
Electronic_ISBN :
1065-2221
Type :
conf
DOI :
10.1109/STHERM.2009.4810726
Filename :
4810726
Link To Document :
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