Title :
On-line Batch Process Monitoring Using SVM-Based MPLS
Author_Institution :
Sch. of Electron. & Electr. Eng., Shanghai Second Polytech. Univ., Shanghai, China
Abstract :
This paper integrates support vector machines (SVM) into multiway partial least squares (MPLS) resulting in a nonlinear MPLS model and the model is developed for on-line fault detection in batch processes. Process data from normal historical batches are used to develop the MPLS model, and a series of single-input-single-output SVM networks are adopted to approximate nonlinear inner relationship between input and output variables. In addition, the application of a time-lagged window technique not only makes the complementarities of unmeasured data of the monitored batch unnecessary, but also significantly reduces the computation and storage requirements in comparison with the traditional MPLS. The proposed approach is able to used for real-time process monitoring and fault diagnosis via T2-chart, SPE-chart, and contribution plot for a fed-batch penicillin production.
Keywords :
batch processing (industrial); fault diagnosis; least squares approximations; monitoring; pharmaceutical industry; production engineering computing; support vector machines; SPE-chart; SVM-based MPLS; T2-chart; batch processes; fault diagnosis; fed-batch penicillin production; multiway partial least squares; nonlinear MPLS model; online batch process monitoring; online fault detection; real-time process monitoring; single-input-single-output SVM networks; support vector machines; time-lagged window; Artificial neural networks; Batch production systems; Data models; Monitoring; Multiprotocol label switching; Support vector machines; fault diagnosis; multiway partial least squares (MPLS); process monitoring; support vector machines (SVM); time-lagged window; variable estimation;
Conference_Titel :
Computational Aspects of Social Networks (CASoN), 2010 International Conference on
Conference_Location :
Taiyuan
Print_ISBN :
978-1-4244-8785-1
DOI :
10.1109/CASoN.2010.106