• DocumentCode
    3101914
  • Title

    Fabrication and performance of tree-branch microchannels in silicon carbide for direct cooling of high-power electronics applications

  • Author

    Carter, Jason A. ; Forster, Lucas A. ; Stitt, Mark D.

  • Author_Institution
    Electro-Opt. Center, Pennsylvania State Univ., Freeport, PA
  • fYear
    2009
  • fDate
    15-19 March 2009
  • Firstpage
    128
  • Lastpage
    133
  • Abstract
    For applications where space restrictions limit the feasibility of heat spreading in high-powered electronic devices, integrated direct cooling is a viable but under explored method for keeping critical devices cool. Direct integrated cooling by putting microchannels of varying designs into common device substrate materials (e.g., SiC) is examined. Laser machined microchannels are shown to be a feasible method for fabricating microchannels into materials where etching is not. The flexibility of laser machining to fabricate more complex microchannel designs is assessed and tree-branch or ldquofractal-likerdquo microchannels are shown to provide considerable reduction in pressure drop for a given flow rate compared to traditional straight microchannels.
  • Keywords
    cooling; heat sinks; laser beam machining; microchannel flow; power semiconductor devices; silicon compounds; thermal management (packaging); wide band gap semiconductors; SiC; common device substrate materials; electronics packaging; heat sinks; high-power electronics applications; high-powered electronic devices; integrated direct cooling; laser machined microchannels; silicon carbide; space restrictions; tree-branch microchannels; Electronics cooling; Etching; Fabrication; Machining; Microchannel; Optical design; Optical materials; Silicon carbide; Space cooling; Space heating; Microchannel; fractal; integrated cooling; laser machining; silicon carbide; tree-branch;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2009. SEMI-THERM 2009. 25th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4244-3664-4
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2009.4810753
  • Filename
    4810753