Title :
Low cost concurrent error detection for lattice wave digital filters
Author :
Yousefi, R. ; Sargolzaie, M.H. ; Fakhraie, S. Mehdi
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran
Abstract :
Wave digital filters are widely used in digital signal processing systems due to their implementation advantages such as low sensitivity, good round-off noise and wide dynamic range. A low-cost on-line test scheme for wave digital filters is proposed. Area overhead is reduced significantly with the aim to bring online testing to costumer electronics. 20% fault coverage improvement is also achieved by using the proposed simple test scheme.
Keywords :
error detection; lattice filters; sensitivity analysis; wave digital filters; costumer electronic; digital signal processing system; lattice wave digital filter; low cost concurrent error detection; low sensitivity; low-cost on-line test scheme; round-off noise; wide dynamic range; Automatic testing; Costs; Digital filters; Digital signal processing; Dynamic range; Electronic equipment testing; Fault tolerance; Hardware; Lattices; Signal processing algorithms;
Conference_Titel :
Telecommunications, 2008. IST 2008. International Symposium on
Conference_Location :
Tehran
Print_ISBN :
978-1-4244-2750-5
Electronic_ISBN :
978-1-4244-2751-2
DOI :
10.1109/ISTEL.2008.4651371
