• DocumentCode
    3102247
  • Title

    Comparative study of the current and voltage controllers applied to the STATCOM

  • Author

    Ortiz, Abnery J. ; Aredes, Mauricio ; Bueno, E. ; Rodriguez, Paul

  • Author_Institution
    Fed. Univ. of Rio de Janeiro, Rio de Janeiro
  • fYear
    2007
  • fDate
    5-8 Nov. 2007
  • Firstpage
    2343
  • Lastpage
    2348
  • Abstract
    The aim of this paper is to present a comparative study, from the point of view of the stability, for the current and voltage controllers applied to the STATCOM. It is well known that the STATCOM is considered as a controllable AC voltage source behind a leakage reactance. But due to its shunt connection, the STATCOM can be also regarded as a controllable AC current source. Considering these characteristics, two kinds of control strategies can be utilized. The first one, acting on the current injected by the STATCOM and the second one acting on the voltage supplied by it. In the last one, there is only one manner to measure the feedback signal, whereas in the current control there are two ones. Additionally, either a typical PI (proportional integral) or a PR (proportional resonant) controller can be used for the purpose of enhancing the steady state response of the controller. A comparative study of these alternatives is presented, as well as computer simulations on PSCAD, so as to verify the performance of the controllers.
  • Keywords
    PI control; electric current control; feedback; static VAr compensators; voltage control; PI control; STATCOM; controllable AC voltage source; current controllers; feedback signal; leakage reactance; proportional integral control; proportional resonant controller; voltage controllers; Automatic voltage control; Current control; Current measurement; Feedback; Pi control; Proportional control; Resonance; Stability; Steady-state; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 2007. IECON 2007. 33rd Annual Conference of the IEEE
  • Conference_Location
    Taipei
  • ISSN
    1553-572X
  • Print_ISBN
    1-4244-0783-4
  • Type

    conf

  • DOI
    10.1109/IECON.2007.4460385
  • Filename
    4460385