• DocumentCode
    3102271
  • Title

    Variable-step 12-bit ADC based on counter ramp recycling architecture suitable for CMOS imagers with column-parallel readout

  • Author

    Hassan, Tarek M. ; Strobel, M. ; Richter, H. ; Burghartz, Joachim N.

  • Author_Institution
    Inst. for Microelectron. Stuttgart (IMS CHIPS), Stuttgart, Germany
  • fYear
    2013
  • fDate
    24-27 June 2013
  • Firstpage
    41
  • Lastpage
    44
  • Abstract
    A 12-bit counter ramp recycling analog-to-digital converter (ADC) is proposed, which can be configured in a single-step mode for achieving high conversion accuracy as well as in various multi-step modes for yielding high conversion speed. A unique ADC circuit realization is used for the different modes of operation, while a digital control unit is responsible for providing the necessary control signals to the ADC. Similar to common counter ramp architectures, the proposed implementation is suitable for column-parallel readout owing to its simplicity. The proposed variable-step recycling ADC is implemented in a 0.18μm CMOS technology from UMC. Simulation results show good agreement with the expected trade-off between speed and accuracy, which is common to all conventional ADCs.
  • Keywords
    CMOS image sensors; analogue-digital conversion; CMOS imagers; UMC; analog-to-digital converter; column-parallel readout; control signals; counter ramp recycling architecture; digital control unit; multistep modes; single-step mode; size 0.18 mum; variable-step ADC; word length 12 bit; Accuracy; CMOS integrated circuits; Clocks; Generators; Radiation detectors; Recycling; Switches; algorithmic; analog-to-digital converters; column-parallel; counter ramp; multi-step;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ph.D. Research in Microelectronics and Electronics (PRIME), 2013 9th Conference on
  • Conference_Location
    Villach
  • Print_ISBN
    978-1-4673-4580-4
  • Type

    conf

  • DOI
    10.1109/PRIME.2013.6603107
  • Filename
    6603107