• DocumentCode
    3102405
  • Title

    Multi-bandwidth frequency selective surfaces for near infrared filtering: design and optimization

  • Author

    Cwik, T. ; Fernandez, S. ; Ksendzov, A. ; La Baw, C.C. ; Maker, P.D. ; Muller, R.E.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    3
  • fYear
    1999
  • fDate
    11-16 July 1999
  • Firstpage
    1726
  • Abstract
    The design of sub-millimeter filters follows the design methods used in the microwave region. Exacting modal matching, integral equation or finite element methods can be used for design. A major difference though is the introduction of material parameters and thicknesses that may not be important in longer wavelength designs. This paper describes the design of multibandwidth filters operating in the 1-5 micrometer wavelength range. In this paper extensions based on further optimization and an examination of the specific shape of the element in the periodic cell are reported. Results from the design, manufacture and test of linear wedge filters built using microlithographic techniques and used in spectral imaging applications are presented.
  • Keywords
    circuit optimisation; finite element analysis; frequency selective surfaces; integral equations; lithography; modal analysis; optical filters; 1 to 5 micron; finite element methods; integral equation; linear wedge filters; manufacture; material parameters; material thickness; microlithographic techniques; modal matching; multi-bandwidth frequency selective surfaces; near infrared filtering; periodic cell; spectral imaging applications; sub-millimeter filter design; sub-millimeter filter optimisation; testing; Design methodology; Finite element methods; Frequency selective surfaces; Integral equations; Manufacturing; Microwave filters; Microwave theory and techniques; Nonlinear filters; Shape; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1999. IEEE
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-5639-x
  • Type

    conf

  • DOI
    10.1109/APS.1999.788287
  • Filename
    788287