Power Conversion with SiC Devices at Extremely High Ambient Temperatures

This paper evaluates the capability of SiC devices for operation under extremely high ambient temperatures. To this end, the authors packaged SiC JFET and Schottky barrier diodes (SBD) in thermally stable packages and built a high-temperature inductor to be evaluated in a DC-DC buck converter. The DC characteristics of the SiC JFET devices were first measured at ambient temperatures ranging from room temperature up to 450 degC. The experimental results show that the device can operate at 450 degC, which is impossible for conventional Si devices, but as expected the current capability of the SiC JFET diminishes with rising temperatures. A DC-DC converter was then designed and built in accordance with the static characteristics of the SiC JFETs that were measured under extremely high ambient temperatures. The converter was tested up to an ambient temperature of 400 degC. The conduction loss of the SiC JFET increases slightly, as predicted from its DC characteristics, but its switching characteristics hardly change with increasing temperatures. Thus, SiC devices are well suited for operation in harsh temperature environments