DocumentCode
3104
Title
Progress in Laser-Crystallized Thin-Film Polycrystalline Silicon Solar Cells: Intermediate Layers, Light Trapping, and Metallization
Author
Dore, Jonathon ; Ong, Dennis ; Varlamov, Sergey ; Egan, Renate ; Green, Martin A.
Author_Institution
Univ. of New South Wales, Sydney, NSW, Australia
Volume
4
Issue
1
fYear
2014
fDate
Jan. 2014
Firstpage
33
Lastpage
39
Abstract
Diode laser crystallization of thin silicon films on the glass has been used to form polycrystalline silicon layers for solar cells. Properties of an intermediate layer stack of sputtered SiOx/SiNx/SiOx between the glass and the silicon have been improved by reactively sputtering the SiNx layer, which result in enhanced optical and electrical performance. Light trapping is further enhanced by texturing the rear surface of the silicon prior to metallization. An initial efficiency of 11.7% with VOC of 585 mV has been achieved using this technique, which are the highest values reported for poly-Si solar cells on glass substrates. Cells suffer a short term, recoverable degradation of VOC, and fill factor. The magnitude of the degradation is reduced via the repeated thermal treatment. A selective p+ metallization scheme has been developed which eliminates the degradation altogether.
Keywords
heat treatment; metallisation; semiconductor lasers; silicon; silicon compounds; solar cells; sputter deposition; surface texture; thin films; Si; SiOx-SiNx-SiOx; diode laser crystallization; efficiency 11.7 percent; glass substrates; intermediate layer stack; intermediate layers; laser-crystallized solar cells; light trapping; p+ metallization; poly-Si solar cells; polycrystalline silicon layers; polycrystalline silicon solar cells; sputtering; surface texturing; thermal treatment; thin-film solar cells; voltage 585 mV; Absorption; Aluminum; Degradation; Glass; Metallization; Photovoltaic cells; Silicon; Lasers; photovoltaic cells; silicon; thin-film devices;
fLanguage
English
Journal_Title
Photovoltaics, IEEE Journal of
Publisher
ieee
ISSN
2156-3381
Type
jour
DOI
10.1109/JPHOTOV.2013.2280016
Filename
6595024
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