Title :
3dB squeezing in photon number fluctuations from high-speed light emitting diodes
Author :
Shinozaki, G. ; Hirano, T. ; Kuga, T. ; Yamanishi, M.
Keywords :
Bandwidth; Capacitance; Circuit noise; Equivalent circuits; Light emitting diodes; Power amplifiers; Semiconductor device noise; Semiconductor diodes; Temperature; Voltage fluctuations;
Conference_Titel :
Lasers and Electro-Optics, 1995. Technical Digest. CLEO/Pacific Rim'95., Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-2400-5
DOI :
10.1109/CLEOPR.1995.521308