• DocumentCode
    3104022
  • Title

    Improvement of reliability of closing latch in spring type operating mechanism of high voltage circuit breakers

  • Author

    Yu, Li ; Xue, Xiaohui ; Wang, Jianhua ; Geng, Yingsan ; Liu, Zhiyuan ; Wei, Shiping ; You, Zhaogui

  • Author_Institution
    State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an, China
  • fYear
    2012
  • fDate
    7-10 May 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Occasionally closing operation failures occurred when a spring type operating mechanism was used to operate a high voltage circuit breaker with higher loads. This kind of failures is a high risk for circuit breakers. The objective of this paper is to propose a concept of reset time difference of a trip-open unit and to improve the reliability of closing operation of a high voltage circuit breaker with a spring type operating mechanism based on the reset time difference. In a spring type operating mechanism, there is a big latch and a small latch in a trip-open latch unit. In a close operation of a high voltage circuit breaker driven by a spring type operating mechanism, there is a time lag between the big latch and the small latch when they reach their final latched positions. And we definite the time lag as the reset time difference (TR). The experimental results showed that the reliability of closing operation can be guaranteed with TR was higher than 10ms. And TR increased with an increase of a preload of the big latch spring. And the bounces of the small latch were the most significant factor to cause a closing operation failure. An improvement from the point of view of time reset difference (TR) enhanced the reliability of closing operation of a high voltage circuit breaker.
  • Keywords
    circuit breakers; fault diagnosis; reliability; big latch; closing latch; high voltage circuit breakers; reliability improvement; reset time difference; small latch; spring type operating mechanism; time lag; trip-open latch unit; trip-open unit; Circuit breakers; Integrated circuit reliability; Latches; Maintenance engineering; Power system reliability; Springs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transmission and Distribution Conference and Exposition (T&D), 2012 IEEE PES
  • Conference_Location
    Orlando, FL
  • ISSN
    2160-8555
  • Print_ISBN
    978-1-4673-1934-8
  • Electronic_ISBN
    2160-8555
  • Type

    conf

  • DOI
    10.1109/TDC.2012.6281558
  • Filename
    6281558