Title :
Optical measurements based on RF modulation techniques
Author_Institution :
Hewlett-Packard Co., Santa Rosa, CA, USA
Abstract :
A characterization concept for high-speed lightwave components based on high-frequency RF modulation of the test signals is introduced. The concept is first explained by using the example of optical transmission measurements covering optical loss, modulation bandwidth, and length measurements. Subsequently, optical reflection measurements with the capability of separating multiple reflections with millimeter resolution and kilometer range without a dead zone are investigated. In addition, responsivity measurements of electrooptical devices, such as lasers and photodiodes, are investigated
Keywords :
high-speed optical techniques; laser variables measurement; optical testing; optical variables measurement; photodiodes; reflectivity; reflectometry; RF modulation; electrooptical devices; high-speed lightwave components; lasers; length measurements; modulation bandwidth; multiple reflections; optical loss; optical reflection measurements; optical transmission measurements; photodiodes; responsivity measurements; High speed optical techniques; Length measurement; Loss measurement; Optical losses; Optical modulation; Optical reflection; Propagation losses; RF signals; Radio frequency; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE
Conference_Location :
San Jose, CA
DOI :
10.1109/IMTC.1990.66033
