Optical measurements based on RF modulation techniques

Author

Vifian, Hugo

Author_Institution

Hewlett-Packard Co., Santa Rosa, CA, USA

fYear

1990

fDate

13-15 Feb 1990

Firstpage

334

Lastpage

338

Abstract

A characterization concept for high-speed lightwave components based on high-frequency RF modulation of the test signals is introduced. The concept is first explained by using the example of optical transmission measurements covering optical loss, modulation bandwidth, and length measurements. Subsequently, optical reflection measurements with the capability of separating multiple reflections with millimeter resolution and kilometer range without a dead zone are investigated. In addition, responsivity measurements of electrooptical devices, such as lasers and photodiodes, are investigated

Keywords

high-speed optical techniques; laser variables measurement; optical testing; optical variables measurement; photodiodes; reflectivity; reflectometry; RF modulation; electrooptical devices; high-speed lightwave components; lasers; length measurements; modulation bandwidth; multiple reflections; optical loss; optical reflection measurements; optical transmission measurements; photodiodes; responsivity measurements; High speed optical techniques; Length measurement; Loss measurement; Optical losses; Optical modulation; Optical reflection; Propagation losses; RF signals; Radio frequency; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE

Conference_Location

San Jose, CA

Type

conf

DOI

10.1109/IMTC.1990.66033

Filename

66033