Title :
2004 ROCS Workshop Proceedings [Reliability of Compound Semiconductors] (IEEE Cat. No. 04TH8787)
Abstract :
Presents the table of contents of the proceedings.
Keywords :
III-V semiconductors; capacitors; field effect transistors; gallium arsenide; heterojunction bipolar transistors; high electron mobility transistors; p-i-n diodes; semiconductor device reliability; thermal resistance; GaAs; HBT reliability; HFET; PIN switches; capacitors; device thermal resistance; pHEMT; two-terminal devices; Capacitors; FETs; Gallium compounds; Heterojunction bipolar transistors; MODFETs; Semiconductor device reliability; Thermoresistivity; p-i-n diodes;
Conference_Titel :
ROCS Workshop, 2004.[Reliability of Compound Semiconductors]
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7908-0105-1
DOI :
10.1109/ROCS.2004.184333
