• DocumentCode
    3105296
  • Title

    Design of a multi-screen deflectometer for shape measurement of solder joints on a PCB

  • Author

    Hong, Deokhwa ; Park, Heechan ; Cho, Hyungsuck

  • Author_Institution
    Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • fYear
    2009
  • fDate
    5-8 July 2009
  • Firstpage
    127
  • Lastpage
    132
  • Abstract
    Solder joint shape measurement is one of the most challenging technique which is essential for automation of PCB inspection. It is difficult because the surface reflection is specular. Among several kinds of specular shape measurement techniques, deflectometry is suitable to measure the 3D profile of a specular free-form surface because of its high accuracy and short inspection time. In that a pattern displayed on a screen is reflected to be imaged on a image sensor. The surface shape is reconstructed from the distortion of the pattern. The major limitation of deflectometry is its limited measurable slope angle caused by the physical size of the screen. In this paper, we propose a multi-screen deflectometer to increase the measurable slope angle for solder joint measurement. And proper calibration method and shape reconstruction algorithm are developed. This idea is verified by experimental results, in which phase information is successfully extracted from the area which are not normally measurable due to its high curvature surface.
  • Keywords
    calibration; image sensors; printed circuits; screens (display); shape measurement; solders; 3D specular free-form surface measurement; PCB; calibration method; image sensor; multiscreen deflectometer; pattern distortion; phase information extraction; slope angle measurement; solder joint shape measurement; surface reflection; Automation; Distortion measurement; Goniometers; Image sensors; Inspection; Reflection; Shape measurement; Soldering; Surface reconstruction; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-4347-5
  • Electronic_ISBN
    978-1-4244-4349-9
  • Type

    conf

  • DOI
    10.1109/ISIE.2009.5213206
  • Filename
    5213206