Title :
Detection of PLA multiple crosspoint faults
Author :
Ambanelli, M. ; Favalli, M. ; Olivo, P. ; Riccó, B.
Author_Institution :
Bologna Univ., Italy
Abstract :
An original approach to fault simulation of crosspoint faults in PLAs that goes beyond the normal assumption of single defects is presented: such a method, using concepts derived from critical path backtracing, makes use of the minimum set of information needed for exact, complete analysis without treating each fault individually. Experimental results are also presented to show the importance of multiple faults in common PLAs as well as to discuss the simulator performance
Keywords :
digital simulation; fault location; logic arrays; logic testing; PLA; critical path backtracing; fault simulation; multiple crosspoint faults; multiple faults; single defects; Analytical models; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Information analysis; Performance analysis; Programmable logic arrays; Very large scale integration;
Conference_Titel :
Design Automation. EDAC., Proceedings of the European Conference on
Conference_Location :
Amsterdam
DOI :
10.1109/EDAC.1991.206364
