DocumentCode
3105477
Title
Detection of PLA multiple crosspoint faults
Author
Ambanelli, M. ; Favalli, M. ; Olivo, P. ; Riccó, B.
Author_Institution
Bologna Univ., Italy
fYear
1991
fDate
25-28 Feb 1991
Firstpage
80
Lastpage
84
Abstract
An original approach to fault simulation of crosspoint faults in PLAs that goes beyond the normal assumption of single defects is presented: such a method, using concepts derived from critical path backtracing, makes use of the minimum set of information needed for exact, complete analysis without treating each fault individually. Experimental results are also presented to show the importance of multiple faults in common PLAs as well as to discuss the simulator performance
Keywords
digital simulation; fault location; logic arrays; logic testing; PLA; critical path backtracing; fault simulation; multiple crosspoint faults; multiple faults; single defects; Analytical models; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Information analysis; Performance analysis; Programmable logic arrays; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation. EDAC., Proceedings of the European Conference on
Conference_Location
Amsterdam
Type
conf
DOI
10.1109/EDAC.1991.206364
Filename
206364
Link To Document