• DocumentCode
    3105655
  • Title

    [Back cover]

  • fYear
    2004
  • fDate
    24-24 Oct. 2004
  • Firstpage
    152
  • Lastpage
    152
  • Abstract
    Presents the back cover of the proceedings.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ROCS Workshop, 2004.[Reliability of Compound Semiconductors]
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7908-0105-1
  • Type

    conf

  • DOI
    10.1109/ROCS.2004.184356
  • Filename
    1424948