• DocumentCode
    3105813
  • Title

    Electrical characteristics of silicon and germanium nanowire transistors - a simulation study

  • Author

    Chandra, S.T. ; Balamurugan, N.B.

  • Author_Institution
    Dept. of ECE, Thiagarajar Coll. of Eng., Madurai, India
  • fYear
    2012
  • fDate
    28-29 Dec. 2012
  • Firstpage
    165
  • Lastpage
    167
  • Abstract
    Nanowire Transistors have attracted attention due to the probable high performance and excellent controllability of device current. In this paper, we investigate the electrical characteristics of nanowire transistors made of silicon and germanium materials. The nanowire transistor has a 3D distribution of electron density and electrostatic potential, therefore self-consistent 3D simulations are used. Nanowire (tool) is a 3D Poisson self-consistent simulator which can study the 3D transport in nanowire transistor considering phonon scattering based on the effective-mass approximation. The transport orientation of (100) is considered. The output characteristics, Density of States and 1D electron density profile of the nanowire transistor are studied in detail for both Si and Ge material.
  • Keywords
    MOSFET; effective mass; electronic density of states; elemental semiconductors; germanium; nanowires; silicon; 1D electron density profile; 3D Poisson self-consistent simulator; 3D distribution; 3D transport; Ge; Si; density of states; device current; effective-mass approximation; electrical characteristics; electrostatic potential; germanium materials; nanowire transistors; phonon scattering; self-consistent 3D simulations; silicon materials; transport orientation; Decision support systems; Hafnium compounds; Intelligent systems; Density of States (DOS); ID electron density profile; Uncoupled mode space approach; phonon scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Devices and Intelligent Systems (CODIS), 2012 International Conference on
  • Conference_Location
    Kolkata
  • Print_ISBN
    978-1-4673-4699-3
  • Type

    conf

  • DOI
    10.1109/CODIS.2012.6422162
  • Filename
    6422162