• DocumentCode
    3106202
  • Title

    TATOO: an industrial timing analyzer with false path elimination and test pattern generation

  • Author

    Benkoski, Jacques ; Stewart, Ronald H.

  • Author_Institution
    SGS-Thomson Microelectron., Grenoble, France
  • fYear
    1991
  • fDate
    25-28 Feb 1991
  • Firstpage
    256
  • Lastpage
    260
  • Abstract
    TATOO is an industrial interactive timing analysis system evolved from recently developed false path elimination algorithms. These have been extended to perform more complex searches that facilitate the rapid survey of a network. An automatic test pattern generation mechanism which exercises the statically sensitizable paths has been developed. This forms a direct link to an electrical simulator. The critical path through a network of hundreds of gates is found, the test pattern generated, the critical path simulated, and the resulting waveforms displayed in less than two minutes
  • Keywords
    automatic testing; circuit analysis computing; logic testing; TATOO; critical path simulation; false path elimination; industrial timing analyzer; statically sensitizable paths; test pattern generation; Algorithm design and analysis; Automatic testing; Circuit simulation; Circuit testing; Logic testing; Pattern analysis; Signal analysis; Test pattern generators; Timing; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation. EDAC., Proceedings of the European Conference on
  • Conference_Location
    Amsterdam
  • Type

    conf

  • DOI
    10.1109/EDAC.1991.206403
  • Filename
    206403