DocumentCode
3106202
Title
TATOO: an industrial timing analyzer with false path elimination and test pattern generation
Author
Benkoski, Jacques ; Stewart, Ronald H.
Author_Institution
SGS-Thomson Microelectron., Grenoble, France
fYear
1991
fDate
25-28 Feb 1991
Firstpage
256
Lastpage
260
Abstract
TATOO is an industrial interactive timing analysis system evolved from recently developed false path elimination algorithms. These have been extended to perform more complex searches that facilitate the rapid survey of a network. An automatic test pattern generation mechanism which exercises the statically sensitizable paths has been developed. This forms a direct link to an electrical simulator. The critical path through a network of hundreds of gates is found, the test pattern generated, the critical path simulated, and the resulting waveforms displayed in less than two minutes
Keywords
automatic testing; circuit analysis computing; logic testing; TATOO; critical path simulation; false path elimination; industrial timing analyzer; statically sensitizable paths; test pattern generation; Algorithm design and analysis; Automatic testing; Circuit simulation; Circuit testing; Logic testing; Pattern analysis; Signal analysis; Test pattern generators; Timing; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation. EDAC., Proceedings of the European Conference on
Conference_Location
Amsterdam
Type
conf
DOI
10.1109/EDAC.1991.206403
Filename
206403
Link To Document