Title :
Diagnosis of tunneling opens
Author :
Li, James C M ; McCluskey, E.J.
Author_Institution :
Center for Reliable Comput., Stanford Univ., CA, USA
Abstract :
This paper resolves two issues regarding diagnosis of tunneling opens: efficient screening and accurate localization. In the first part, a test pattern selection and sorting algorithm is presented. It is shown that the presented algorithm saves IDDQ(t) test time without impacting on its effectiveness. The second part of this paper presents a locating algorithm which combines both VLV and IDDQ(t) test results. This technique is shown to be able to accurately locate the tunneling opens with higher resolution than commercial single stuck-at fault diagnosis tool
Keywords :
automatic testing; failure analysis; integrated circuit testing; integrated circuit yield; production testing; localization; locating algorithm; screening; sorting algorithm; test pattern selection; tunneling opens; Automatic test pattern generation; Circuit faults; Circuit testing; Cyclic redundancy check; Fault diagnosis; Semiconductor device measurement; Sorting; Test pattern generators; Tunneling; Voltage;
Conference_Titel :
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location :
Marina Del Rey, CA
Print_ISBN :
0-7695-1122-8
DOI :
10.1109/VTS.2001.923413
