Title :
Frequency-directed run-length (FDR) codes with application to system-on-a-chip test data compression
Author :
Chandra, Anshuman ; Chakrabarty, Krishnendu
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Abstract :
We showed recently that Golomb codes can be used for efficiently compressing system-on-a-chip test data. We now present a new class of variable-to-variable-length compression codes that are designed using the distributions of the runs of 0s in typical test sequences. We refer to these as frequency-directed run-length (FDR) codes. We present experimental results for the ISCAS 89 benchmark circuits to show that FDR codes outperform Golomb codes for test data compression. We also present a decompression architecture for FDR codes, and an analytical characterization of the amount of compression that can be expected using these codes. Analytical results show that FDR codes are robust, i.e. they are insensitive to variations in the input data stream
Keywords :
application specific integrated circuits; automatic testing; data compression; integrated circuit testing; logic testing; runlength codes; ISCAS 89 benchmark circuits; decompression architecture; frequency-directed run-length codes; input data stream; system-on-a-chip test; test data compression; test sequences; variable-to-variable-length compression codes; Automatic testing; Built-in self-test; Channel capacity; Circuit testing; Data compression; Frequency; Intellectual property; System testing; System-on-a-chip; Test data compression;
Conference_Titel :
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location :
Marina Del Rey, CA
Print_ISBN :
0-7695-1122-8
DOI :
10.1109/VTS.2001.923416
