DocumentCode :
3106943
Title :
An Efficient Active Bayes Classifier Using Affinity Propagation on Unlabeled Data
Author :
Xianhui, Wang ; Zheng, Qin ; XuanPing, Zhang
Author_Institution :
Sch. of Electron. & Inf. Eng., Xi´´an Jiaotong Univ., Xi´´an, China
fYear :
2009
fDate :
13-14 Dec. 2009
Firstpage :
440
Lastpage :
443
Abstract :
When the labeled data are few, exploiting amount of unlabeled data can be helpful for improve learning performance of classifier. The key issue for active learning to solve is how to select the most ¿valuable¿ training samples to reduce labeled cost of amount of unlabeled samples. In the paper, we propose an efficient active Bayes classifier by using affinity propagation (AP) to select the most valuable samples on the unlabeled data sets. Firstly, the method clusters amount of unlabeled sample data by using AP algorithm. Secondly, through exemplars obtained from the results of cluster and similarity matrix, the method selects the unlabeled samples for experts to label. The method choose two kinds of most valuable instances to label: one is cluster center instance, which also called exemplar instance. Another is the instance which stays in the farthest position to the cluster center in the same cluster, that is, the sample which sets in the nearest position to the cluster boundary. The experiment results on UCI data sets demonstrate that our method is simple and more efficient compared with traditional active learning method.
Keywords :
Bayes methods; data handling; learning (artificial intelligence); matrix algebra; pattern classification; active Bayes classifier; active learning; affinity propagation; similarity matrix; unlabeled data; Clustering algorithms; Conference management; Data engineering; Error analysis; Information management; Information technology; Learning systems; Sampling methods; Supervised learning; Training data; active learning; affinity propagation; naive Bayes classifier; unlabeled data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Future Information Technology and Management Engineering, 2009. FITME '09. Second International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-5339-9
Type :
conf
DOI :
10.1109/FITME.2009.116
Filename :
5381022
Link To Document :
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