DocumentCode
3106985
Title
Test waveform shaping in mixed signal test bus by pre-equalization
Author
Chen, Yue-Tsang ; Su, Chauchin
Author_Institution
Electron. Res. Lab., Chung Shan Inst. of Sci. & Technol., Lung-Tan, Taiwan
fYear
2001
fDate
2001
Firstpage
260
Lastpage
265
Abstract
A DSP based methodology to generate compensative stimuli is proposed to remove the parasitic effects in analog test buses. Experiments, using HSPICE simulation, show that the differences between stimuli and ideal signal are less then 1% with only 64 sample points
Keywords
compensation; equalisers; filtering theory; integrated circuit testing; least mean squares methods; mixed analogue-digital integrated circuits; DSP based methodology; HSPICE simulation; analog test buses; channel effect compensation; compensative stimuli generation; mixed signal test bus; parasitic effects removal; pre-equalization; test waveform shaping; Consumer electronics; Crosstalk; Design for testability; Digital signal processing; Distortion; Frequency; Mobile communication; Testing; Transceivers; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location
Marina Del Rey, CA
Print_ISBN
0-7695-1122-8
Type
conf
DOI
10.1109/VTS.2001.923448
Filename
923448
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