DocumentCode
3107172
Title
SPIRIT: a highly robust combinational test generation algorithm
Author
Gizdarski, Emil ; Fujiwara, Hideo
Author_Institution
Dept. of Comput. Syst., Rousse Univ., Bulgaria
fYear
2001
fDate
2001
Firstpage
346
Lastpage
351
Abstract
In this paper we present a robust test generation algorithm for combinational circuits based on the Boolean satisfiability method called SPIRIT. We elaborate some well-known techniques as well as presenting new techniques that improve the performance and robustness of test generation algorithms. As a result, SPIRIT achieves 100% fault efficiency for a full scan version of the ITC´99 benchmark circuits in a reasonable amount of time
Keywords
Boolean functions; automatic testing; combinational circuits; fault diagnosis; integrated circuit testing; logic testing; Boolean satisfiability method; ITC´99 benchmark circuits; SPIRIT; combinational circuits; combinational test generation algorithm; fault efficiency; full scan version; robustness; Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Electronic design automation and methodology; Electronic mail; Logic testing; Robustness; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Conference_Location
Marina Del Rey, CA
Print_ISBN
0-7695-1122-8
Type
conf
DOI
10.1109/VTS.2001.923461
Filename
923461
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