• DocumentCode
    3107262
  • Title

    Tools for the characterization of bipolar CML testability

  • Author

    Monte, Ginette ; Antaki, Bernard ; Patenaude, Serge ; Savaria, Yvon ; Thibeault, Claude ; Trouborst, Pieter

  • Author_Institution
    Ecole Polytech., Montreal, Que., Canada
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    388
  • Lastpage
    395
  • Keywords
    Application specific integrated circuits; Automatic logic units; Circuit analysis; Circuit faults; Circuit simulation; Costs; Design for testability; Libraries; Logic testing; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
  • Print_ISBN
    0-7695-1122-8
  • Type

    conf

  • DOI
    10.1109/VTS.2001.923467
  • Filename
    923467
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3107262