DocumentCode
3107824
Title
Analysis on altimeters´ reliability growth test data
Author
Mei, Wenhua
Author_Institution
Beijing Aeronaut. Technol. Res. Center, China
fYear
2004
fDate
Apr 27-30, 2004
Firstpage
115
Lastpage
117
Abstract
In this paper, two altimeter failure data sets, undergoing reliability growth test under combined environments is analyzed, based on an AMSAA model for multiple item development. The statistical tests show that there is a significant reliability growth, the failure data can be tracked by the AMSAA model, and the altimeter MTBF confidence lower limit is greater than required.
Keywords
altimeters; failure analysis; reliability; statistical analysis; MTBF confidence lower limit; altimeter failure data analysis; altimeter reliability; multiple item development AMSAA model; reliability growth test data; statistical analysis; Data analysis; Failure analysis; Life estimation; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Business of Electronic Product Reliability and Liability, 2004 International Conference on
Print_ISBN
0-7803-8361-3
Type
conf
DOI
10.1109/BEPRL.2004.1308159
Filename
1308159
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