DocumentCode :
3107955
Title :
SMT solder joint´s shape and location optimization using modified genetic algorithm in the dynamic loadings
Author :
Wei, Ling-yun ; Zhao, Mei ; Guo, Qiang ; Zhang, Xiao-chang
Author_Institution :
State Key Lab. of Vibration, Shock & Noise, Shanghai Jiaotong Univ., China
fYear :
2004
fDate :
Apr 27-30, 2004
Firstpage :
169
Lastpage :
173
Abstract :
Vibration fatigue has become an important factor impacting the SMT solder joint reliability and lifetime in dynamic loadings. In this paper shape and location optimization of SMT solder joints under vibration and shock conditions are investigated to raise their reliability and lifetime. A PBGA256 assembly is chosen to investigate the effect of shape and location of a SMT solder joint on its reliability under vibration and shock conditions. Then a modal experiment was performed to obtain the dynamic characteristics of the PBGA256 assembly. A finite element model, which is close to the PBGA256 assembly sample, is built based on the modal experiment. Then a modified genetic algorithm, which is a global optimization method, is used to perform shape and location of SMT solder joints based on the FEM of the PBGA256 assembly under shock conditions. The optimal results show the SMT solder joint with optimal location and shape has less maximum strain. As a result, reliability of SMT solder joint with those optimal parameters is better.
Keywords :
ball grid arrays; fatigue; finite element analysis; genetic algorithms; reliability; soldering; stress-strain relations; surface mount technology; FEM; PBGA256 assembly; SMT; dynamic loadings; finite element model; modal experiment; modified genetic algorithm; shock conditions; solder joint lifetime; solder joint location optimization; solder joint reliability; solder joint shape optimization; solder joint strain; surface mount technology; vibration fatigue; Assembly; Capacitive sensors; Electric shock; Fatigue; Finite element methods; Genetic algorithms; Optimization methods; Shape; Soldering; Surface-mount technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Business of Electronic Product Reliability and Liability, 2004 International Conference on
Print_ISBN :
0-7803-8361-3
Type :
conf
DOI :
10.1109/BEPRL.2004.1308168
Filename :
1308168
Link To Document :
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