Title :
Instantaneous image observation of ultrafast electrical pulse propagating on metal strip
Author :
Takeuchi, K. ; Mizuhara, A.
Author_Institution :
Teratec Corp., Musashino, Japan
Abstract :
Instantaneous potential distribution of 2 ps propagating pulse was visualized using a scanning force optoelectronic microscope. A special probe made of low temperature grown GaAs is the key in the optical sampling measurement.
Keywords :
atomic force microscopy; high-speed optical techniques; optical microscopes; optoelectronic devices; photoconducting switches; probes; 2 ps; GaAs; instantaneous image observation; metal strip; optical sampling measurement; potential distribution; ultrafast electrical pulse; Gallium arsenide; Laser mode locking; Microscopy; Optical films; Optical pulses; Probes; Sampling methods; Strips; Switches; Ultrafast optics;
Conference_Titel :
Microwave Photonics, 1996. MWP '96. Technical Digest., 1996 Internatonal Topical Meeting on
Conference_Location :
Kyoto, Japan
Print_ISBN :
0-7803-3129-X
DOI :
10.1109/MWP.1996.660358
