Title :
Pulsed power electron and ion beams diagnostics based on simultaneous detection of acoustic longitudinal and flexural waves
Author :
Bardenstein, A.L. ; Bykov, V.I. ; Vaisburd, D.I.
Author_Institution :
Inst. of High-Current Electron., Acad. of Sci., Tomsk, Russia
Abstract :
A method and technique for measuring the pulsed power electron and ion beam energy density (W in J/m/sup 2/) absorbed by a target as well as the main elastic constants of material have been proposed and realized. The method developed is based on the authors´ laser-interferometric and theoretical investigations of the space-time characteristics and amplitudes of thermoacoustic waves excited by pulsed power electron beams in various solids: metals; alloys; semiconductors; amorphous and crystalline dielectrics; and composites. Experimental conditions under which compression-expansion pulse of the longitudinal wave and flexural oscillations of a sample can be observed simultaneously, have been found. As the experiments have shown, the amplitude of thermoelastic flexural wave as well as the amplitude of longitudinal pulse is proportional to W. The authors reconstruct the profile of beam dose absorbed by material and determine W using available standard samples with known elastic constants and Gruneisen´s parameter and the interferometry data on longitudinal and flexural thermoacoustic waves.
Keywords :
acoustic waves; electron accelerators; electron beams; ion accelerators; ion beams; power supplies to apparatus; pulsed power technology; Gruneisen´s parameter; acoustic flexural waves; acoustic longitudinal waves; beam dose absorption; compression-expansion pulse; elastic constants; electron beam diagnostics; ion accelerators; ion beam diagnostics; pulsed power supplies; space-time characteristics; thermoacoustic waves; Crystalline materials; Density measurement; Dielectric materials; Electron beams; Energy measurement; Ion beams; Optical materials; Power measurement; Pulse measurements; Semiconductor materials;
Conference_Titel :
Pulsed Power Conference, 1995. Digest of Technical Papers., Tenth IEEE International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-2791-8
DOI :
10.1109/PPC.1995.596511