Title :
Modeling breast cell cycle regulation - overcoming drug resistance
Author :
Arlt, Dorit ; Sahin, Ozgur ; Korf, Ulrike ; Loebke, Christian ; Beissbarth, T. ; Hahne, Florian ; Wiemann, Stefan ; Poustka, Annemarie
Author_Institution :
Div. of Molecular Genome Anal., German Cancer Res. Center, Heidelberg
fDate :
Aug. 30 2006-Sept. 3 2006
Abstract :
In breast cancer treatment for many cases intrinsic or acquired resistance against available therapeutics leads to death. According to the present biological understanding, drug resistance is caused by molecular mechanisms in the complex network of proteins that regulate cell proliferation by activation of the estrogen receptor (ER), hereby allowing the cell to bypass the classical estrogen receptor signalling pathway after inhibition of the ER. Target proteins for this study were chosen according to the present understanding of estrogen receptor based cell cycle control, including proteins from genomic and non genomic ER-dependant pathways, as well as from ER-independent signalling events. We used MCF7 cells (ATCC, HTB-22), to generate a Tamoxifen-resistant cell line out of this parental strain. The assay is based on upregulation of genes during Tamoxifen treatment, which allows the cells to proliferate in presence of Tamoxifen
Keywords :
biochemistry; biological organs; cancer; cellular biophysics; drugs; genetics; gynaecology; molecular biophysics; physiological models; proteins; tumours; MCF7 cells; breast cancer treatment; breast cell cycle regulation modeling; cell proliferation; drug resistance; estrogen receptor signalling pathway; genes upregulation; genomic ER-dependant pathways; molecular mechanism; non genomic ER-dependant pathways; protein network; tamoxifen-treatment; target proteins; Bioinformatics; Biological system modeling; Breast cancer; Cells (biology); Complex networks; Drugs; Erbium; Genomics; Immune system; Proteins;
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2006.259761