• DocumentCode
    310835
  • Title

    ESD Protection Design And Applications To Bidirectional Antenna Protection For Sub-5 nm Gate Oxides

  • Author

    Amerasekera, Ajith ; Krishnan, Srikanth

  • Author_Institution
    Texas Instruments Incorporated
  • fYear
    1997
  • fDate
    13-14 May 1997
  • Firstpage
    33
  • Lastpage
    37
  • Keywords
    Biological system modeling; CMOS technology; Circuit testing; Electrostatic discharge; Humans; Integrated circuit testing; Physics; Protection; Pulse circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Process-Induced Damage, 1997., 2nd International Symposium on
  • Conference_Location
    Monterey, California, USA
  • Print_ISBN
    0-9651-5771-7
  • Type

    conf

  • DOI
    10.1109/PPID.1997.596676
  • Filename
    596676
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=310835