Title :
Equivalence Checking Using Cuts And Heaps
Author :
Kuehlmann, Andreas ; Krohm, Florian
Author_Institution :
IBM Thomas J. Watson Research Center
Keywords :
Algorithm design and analysis; Automatic control; Automatic test pattern generation; Binary decision diagrams; Boolean functions; Circuits; Data structures; Design methodology; Encoding; Permission;
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-4093-0
DOI :
10.1109/DAC.1997.597155